Figure 1 -- Sampling fraction vs. incident energy for an electron normally incident on the EEMC.  The fit is to a 3rd degree polynomial in x=log(E).

Figure 2 -- Sampling fraction vs. incident energy for an electron generated at the nominal vertex of (0,0,0) and thrown at the center of 03TC01 (η = 1.11435).

Figure 3 -- Sampling fraction vs. incident energy for an electron generated at the nominal vertex of (0,0,0) and thrown at η = 1.51225.

Figure 4 -- Sampling fraction vs. incident energy for an electron generated at the nominal vertex of (0,0,0) and thrown at center of 03TC12 (η = 1.9504).