2006.09.15 Fit Parameters
Fit Parameters
Fit Function
The plots that follow are sums of individual SMD responses in each plane centered around a common mean (here 0), over a +/-40 strips range. The convention for the parameters in the fits below is:
- p0=E -- area under the curve which represents energy in MeV
- p1=μ -- mean
- p2=σcore -- width of the narrow Gaussian
- p3=γ -- relative contribution of the wide Gaussian to the area/height
- p4=σtail -- width of the wide Gaussian
Simulation
The simulation is from single photons thrown at the EEMC with the following pT distribution:
The highest tower above 4 GeV in total energy is selected and the corresponding SMD sector fitted for peaks in both planes, where the area of the peaks in the U plane is constrained to be identical to that of the peak in the V plane. The peak is shifted to be centered at 0 where peaks from other events are then summed. The summed SMD response in each plane is displayed below:
Ditto in log scale.
Ditto by sector.
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Fit Widths
| Sector # | SMD-u σcore | SMD-u σtail | SMD-v σcore | SMD-v σtail |
| Sector 1 | 0.869033 ± 0.0142868 | 3.42031 ± 0.10226 | 0.84379 ± 0.0185107 | 3.03287 ± 0.0775009 |
| Sector 2 | 0.814959 ± 0.0169271 | 2.99941 ± 0.0730426 | 0.889892 ± 0.0163065 | 3.35288 ± 0.0911979 |
| Sector 3 | 0.84862 ± 0.0148706 | 3.07648 ± 0.0909689 | 0.914377 ± 0.014706 | 3.72821 ± 0.0966915 |
| Sector 4 | 0.924398 ± 0.0144207 | 3.74458 ± 0.10611 | 0.888146 ± 0.0180771 | 3.06618 ± 0.0647075 |
| Sector 5 | 0.934218 ± 0.0163887 | 3.45149 ± 0.0944309 | 0.911209 ± 0.0175273 | 3.28633 ± 0.0890581 |
| Sector 6 | 0.797976 ± 0.0148133 | 3.20464 ± 0.0986085 | 0.822437 ± 0.018835 | 3.30595 ± 0.118813 |
| Sector 7 | 0.836936 ± 0.0150085 | 3.28589 ± 0.0853598 | 0.873338 ± 0.0173883 | 3.16654 ± 0.0838938 |
| Sector 8 | 0.828403 ± 0.0167005 | 3.05517 ± 0.075584 | 0.891045 ± 0.0152102 | 3.34806 ± 0.0836394 |
| Sector 9 | 0.832881 ± 0.0127855 | 3.3214 ± 0.0762928 | 0.8436 ± 0.0175466 | 3.0183 ± 0.079444 |
| Sector 10 | 0.804059 ± 0.0160906 | 3.0943 ± 0.0897946 | 0.874845 ± 0.015788 | 3.18113 ± 0.0748357 |
| Sector 11 | 0.930286 ± 0.0187086 | 3.40024 ± 0.0951671 | 0.854395 ± 0.0167265 | 3.21076 ± 0.0812402 |
| Sector 12 | 3.33227 ± 0.111911 | 0.848668 ± 0.0142344 | 0.895174 ± 0.0160939 | 3.48527 ± 0.12061 |
Data from 2005 pp200 EEMC HT 1 and 2 triggers
In this sample, high tower triggers, eemc-ht1-mb (96251) and eemc-ht2-mb (96261), from the 2005 p+p at √s=200 GeV ppProduction are selected. The highest tower above 4 GeV is chosen and the corresponding SMD sector is searched for peaks in both planes. Peaks from several events are summed together taking care of shifting them around to have a common mean.
Ditto in log scale.
Data from 2005 pp200 electrons
Here, I try to pick a representative sample of electrons from the 2005 pp200 dataset. The cuts used to pick out electrons are:
- Epreshower1 > 5 MeV
- Epreshower2 > 5 MeV
- 0.75 < p/Etower < 1.25
- 3 < dE/dx < 4 keV/cm
The selection for electrons is illustrated in the dE/dx plot below, where the pions should be on the left and the electrons on the right.
Pibero Djawotho Last modified Tue Aug 15 10:41:19 EDT 2006